Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US15747847Application Date: 2016-07-27
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Publication No.: US10304654B2Publication Date: 2019-05-28
- Inventor: Akira Ikegami , Yuta Kawamoto , Hideto Dohi , Manabu Yano , Yutaka Tandai , Hideyuki Kazumi
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2015-149165 20150729
- International Application: PCT/JP2016/071942 WO 20160727
- International Announcement: WO2017/018432 WO 20170202
- Main IPC: H01J37/04
- IPC: H01J37/04 ; H01J37/21 ; H01J37/147 ; H01J37/248 ; H01J37/28

Abstract:
A purpose of the present invention is to provide a charged particle beam device that suppresses an off-axis amount when a field of view moves, said move causing an aberration, and allows large field of view moves to be carried out. In order to achieve the above-mentioned purpose, this charged particle beam device is provided with an objective lens and deflectors for field of view moves, said deflectors deflecting a charged particle beam, and is further provided with an accelerating tube positioned between the objective lens and the deflectors for field of view moves, a power source that applies a voltage to the accelerating tube, and a control device that controls the voltage to be applied to the power source in response to the deflection conditions of the deflectors for field of view moves.
Public/Granted literature
- US20180233320A1 Charged Particle Beam Device Public/Granted day:2018-08-16
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