Invention Grant
- Patent Title: Mass spectrometer with ion frequency selection
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Application No.: US14773902Application Date: 2014-01-24
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Publication No.: US10332736B2Publication Date: 2019-06-25
- Inventor: Kiyomi Yoshinari , Yasushi Terui
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2013-048263 20130311
- International Application: PCT/JP2014/051523 WO 20140124
- International Announcement: WO2014/141756 WO 20140918
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/04 ; H01J49/42

Abstract:
An object of the invention is to provide a mass spectrometer system capable of obtaining a mass spectrum with high resolution as the mass number of an ion becomes higher. In the mass spectrometer system of the invention, a control unit 8 controls a mass spectrometry unit 4 so that a direct current voltage U, an amplitude V of a radio-frequency voltage, and a frequency F of the radio-frequency voltage, which are applied to a quadrupole electrode 13, are increased as a mass-to-charge ratio m/z of an ion of a target for mass spectrometry becomes larger. By controlling in this manner, the ion frequency when the ion passes through the inside of the mass spectrometry unit 4 is increased as the mass number of an ion becomes higher, and therefore, it is possible to obtain the mass spectrum with higher resolution.
Public/Granted literature
- US20160020082A1 MASS SPECTROMETER SYSTEM AND METHOD Public/Granted day:2016-01-21
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