Invention Grant
- Patent Title: Non-contact electrical parameter measurement systems
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Application No.: US15625745Application Date: 2017-06-16
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Publication No.: US10352967B2Publication Date: 2019-07-16
- Inventor: Ronald Steuer , Peter Radda , Ricardo Rodriguez , David L. Epperson , Patrick Scott Hunter , Paul Andrew Ringsrud , Clark N. Huber , Christian Karl Schmitzer , Jeffrey Worones , Michael F. Gallavan
- Applicant: Fluke Corporation
- Applicant Address: US WA Everett
- Assignee: FLUKE CORPORATION
- Current Assignee: FLUKE CORPORATION
- Current Assignee Address: US WA Everett
- Agency: Seed IP Law Group LLP
- Main IPC: G01R15/12
- IPC: G01R15/12 ; G01R15/20 ; G01R15/16 ; G01R19/25 ; G01R1/22 ; G01R15/14 ; G01R19/00

Abstract:
Systems and methods provide measurement of alternating current (AC) electrical parameters in an insulated wire without requiring a galvanic connection between the insulated wire and a test probe. Measurement systems or instruments may include a housing that includes both a non-contact voltage sensor and a non-contact current sensor. The measurement system obtains measurements from the voltage sensor and the current sensor during a measurement time interval and processes the measurements to determine AC electrical parameters of the insulated wire. The AC electrical parameters may be presented to an operator via a visual indicator device (e.g., display, lights). The AC electrical parameters may additionally or alternatively be communicated to an external device via a wired and/or wireless communications interface. The measurement system may include an alignment feedback sensor that provides feedback to a user regarding the mechanical alignment of the insulated wire relative to the voltage sensor and the current sensor.
Public/Granted literature
- US20180136257A1 NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT SYSTEMS Public/Granted day:2018-05-17
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