Invention Grant
- Patent Title: DQS-offset and read-RTT-disable edge control
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Application No.: US16200443Application Date: 2018-11-26
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Publication No.: US10354701B2Publication Date: 2019-07-16
- Inventor: Kallol Mazumder
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/10 ; G11C11/4063 ; H03K19/003 ; H03K19/0175 ; G11C7/22 ; G11C29/02 ; G11C29/50 ; G11C11/4076 ; G11C11/4093

Abstract:
Devices, systems, and methods include controls for on-die termination (ODT) and data strobe signals. For example, a command to de-assert ODT for a data pin (DQ) during the read operation. An input, such as a mode register, receives an indication of a shift mode register value that corresponds to a number of shifts of a rising edge of the command in a backward or a falling edge in a forward direction. A delay chain delays the appropriate edge of received command the number of shifts in the corresponding direction to generate a shifted edge command signal. Combination circuitry then combines a falling edge command signal with a shifted rising edge command signal to form a transformed command.
Public/Granted literature
- US20190096451A1 DQS-OFFSET AND READ-RTT-DISABLE EDGE CONTROL Public/Granted day:2019-03-28
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