Invention Grant
- Patent Title: Reflective mask, reflective mask blank, and manufacturing method therefor
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Application No.: US15138960Application Date: 2016-04-26
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Publication No.: US10372029B2Publication Date: 2019-08-06
- Inventor: Tomohiro Imoto , Norihito Fukugami
- Applicant: TOPPAN PRINTING CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: TOPPAN PRINTING CO., LTD.
- Current Assignee: TOPPAN PRINTING CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Main IPC: G03F1/24
- IPC: G03F1/24 ; C23C14/04 ; C23C16/04 ; C23C28/00

Abstract:
There are provided a reflective mask and a reflective mask blank reducing reflection of out-of-band light and a manufacturing method therefor. A light shielding frame is formed on a mask region corresponding to a multiply exposed boundary region between a chip and a semiconductor substrate. The frame is provided with an antireflective layer causing surface reflection in antiphase to out-of-band light reflected from the surfaces of a rear-surface conductive film and the substrate to provide a reflective mask reducing reflection of out-of-band light. The antireflective layer of the present disclosure has an electrical conductivity of 1×104/mΩ or greater to minimize charging occurring in a pattern region in observing the region using an electron microscope.
Public/Granted literature
- US20170306475A1 REFLECTIVE MASK, REFLECTIVE MASK BLANK, AND MANUFACTURING METHOD THEREFOR Public/Granted day:2017-10-26
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