- 专利标题: Backside stealth dicing through tape followed by front side laser ablation dicing process
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申请号: US16017567申请日: 2018-06-25
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公开(公告)号: US10373857B2公开(公告)日: 2019-08-06
- 发明人: Andy E. Hooper , Nicholas Wade Clyde
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Parsons Behle & Latimer
- 主分类号: H01L21/683
- IPC分类号: H01L21/683 ; H01L21/02 ; B23K26/364 ; H01L21/67 ; H01L21/78 ; H01L21/268 ; B23K101/40
摘要:
A method of forming a plurality of semiconductor devices includes applying a tape material to a back side of a semiconductor device having a silicon layer on the back side and a circuitry layer on the front side, lasing with an infrared laser the silicon layer through the tape material, lasing with a second laser the circuitry layer, and expanding the tape material for form a plurality of semiconductor devices. The second layer may be an ultraviolet laser. The lasers may be irradiated in a pattern on the bottom side and the top side. The second layer may form a groove in the circuitry layer that does not penetrate the silicon layer. The infrared laser may cleave a portion of the silicon lattice of the silicon layer. A coating may be applied to the circuitry layer prior to being irradiated with the second laser.
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