• Patent Title: On-chip trapped ultracold atom sensor allowing rotational velocity to be measured
  • Application No.: US15778605
    Application Date: 2016-11-24
  • Publication No.: US10375813B2
    Publication Date: 2019-08-06
  • Inventor: Matthieu Dupont-NivetSylvain Schwartz
  • Applicant: THALES
  • Applicant Address: FR Courbevoie
  • Assignee: THALES
  • Current Assignee: THALES
  • Current Assignee Address: FR Courbevoie
  • Agency: Baker & Hostetler LLP
  • Priority: FR1502482 20151127
  • International Application: PCT/EP2016/078722 WO 20161124
  • International Announcement: WO2017/089489 WO 20170601
  • Main IPC: G01C19/64
  • IPC: G01C19/64 H05H3/00
On-chip trapped ultracold atom sensor allowing rotational velocity to be measured
Abstract:
Ultra-cold atom sensor for measuring a rotational velocity along a measurement axis comprises: means designed to generate a first and a second ultra-cold atom trap, one trap making it possible to immobilize a cloud of ultra-cold atoms in an internal state different from the other trap, at a predetermined distance from the measurement plane, the means comprising, at least one first and one second waveguide that are designed to propagate microwaves with angular frequencies ωa and ωb, the waveguides being non-secant and positioned symmetrically about an axis called the axis of symmetry, conductive wires integrated into the chip and designed to be flowed through by DC currents, the means being configured to modify the energy of the ultra-cold atoms in such a way as to create a potential minimum for the ultra-cold atoms in the internal state |a> and a potential minimum for the ultra-cold atoms in the internal state |b>, thus forming the first and second ultra-cold atom traps, and to move the traps along a closed path, traveled in one direction by the ultra-cold atoms of the first trap and in the opposite direction by the ultra-cold atoms of the second trap.
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