Invention Grant
- Patent Title: Field effect transistor with stacked nanowire-like channels and methods of manufacturing the same
-
Application No.: US15997596Application Date: 2018-06-04
-
Publication No.: US10381271B2Publication Date: 2019-08-13
- Inventor: Mark S. Rodder , Borna J. Obradovic
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: H01L27/12
- IPC: H01L27/12 ; H01L21/8238 ; H01L27/092 ; H01L29/06 ; H01L29/423 ; H01L29/786 ; H01L21/02 ; H01L29/775 ; B82Y10/00 ; H01L29/66 ; H01L27/04 ; H01L21/84

Abstract:
A field effect transistor includes a fin having a stack of nanowire-like channel regions including at least first and a second nanowire-like channel regions, source and drain electrodes on opposite sides of the fin, a dielectric separation region including a dielectric material between the first and second nanowire-like channel regions, and a gate stack extending along a pair of sidewalls of the stack of nanowire-like channel regions. The dielectric separation region extending completely from a surface of the second nanowire-like channel region facing the first nanowire-like channel region to a surface of the first nanowire-like channel region facing the second nanowire-like channel region. The gate stack includes a gate dielectric layer and a metal layer on the gate dielectric layer. The metal layer of the gate stack does not extend between the first and second nanowire-like channel regions.
Public/Granted literature
- US20180286764A1 FIELD EFFECT TRANSISTOR WITH STACKED NANOWIRE-LIKE CHANNELS AND METHODS OF MANUFACTURING THE SAME Public/Granted day:2018-10-04
Information query
IPC分类: