Invention Grant
- Patent Title: Hydrophilic photoresist, patterning method of quantum dot layer and quantum dot light-emitting diode
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Application No.: US15313910Application Date: 2015-09-29
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Publication No.: US10386724B2Publication Date: 2019-08-20
- Inventor: Bin Zhang , Tingting Zhou , Feng Zhang , Wei Zhang , Jincheng Gao
- Applicant: BOE Technology Group Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BOE Technology Group Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Banner & Witcoff, Ltd.
- Priority: CN201510335044 20150616
- International Application: PCT/CN2015/091031 WO 20150929
- International Announcement: WO2016/201823 WO 20161222
- Main IPC: G03F7/40
- IPC: G03F7/40 ; G03F7/038 ; G03F7/039 ; G03F7/16 ; G03F7/20 ; G03F7/26 ; H01L33/00 ; H01L33/06 ; H01L33/28 ; H01L33/30 ; H01L51/00 ; H01L51/50

Abstract:
A photoresist, a patterning method of a quantum dot layer, a QLED, a quantum dot color filter and a display device are disclosed, which can solve the problem that current patterning methods destroy quantum dots. The patterning method of a quantum dot layer includes the steps of: forming a hydrophilic photoresist pattern which comprises forming a photoresist material layer on a substrate by using a photoresist, patterning the photoresist material layer to form a photoresist pattern, and subjecting the photoresist to hydrophilic treatment; applying quantum dots; removing the quantum dots retained on the photoresist pattern; and stripping the photoresist pattern. The patterning method of a quantum dot layer in the present disclosure can improve the hydrophilic performance of the photoresist and reduce the adhesion of the lipophilic quantum dots on the photoresist.
Public/Granted literature
- US20170176863A1 Hydrophilic Photoresist, Patterning Method of Quantum Dot Layer and Quantum Dot Light-Emitting Diode Public/Granted day:2017-06-22
Information query
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