Invention Grant
- Patent Title: Time-of-flight mass spectrometer using a cold electron beam as an ionization source
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Application No.: US15321563Application Date: 2015-12-04
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Publication No.: US10388506B2Publication Date: 2019-08-20
- Inventor: Mo Yang , Seung Yong Kim , Hyun Sik Kim , Wan Seop Jeong
- Applicant: Korea Basic Science Institute
- Applicant Address: KR Cheongju-si, Chungcheongbuk-do
- Assignee: Kora Basic Science Institute
- Current Assignee: Kora Basic Science Institute
- Current Assignee Address: KR Cheongju-si, Chungcheongbuk-do
- Agency: McAndrews, Held & Malloy, Ltd.
- Priority: KR10-2014-0194149 20141230; KR10-2015-0171695 20151203
- International Application: PCT/KR2015/013252 WO 20151204
- International Announcement: WO2016/108451 WO 20160707
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/08 ; H01J49/14 ; H01J43/10 ; H01J43/24

Abstract:
Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.
Public/Granted literature
- US20170294298A1 TIME-OF-FLIGHT MASS SPECTROMETER Public/Granted day:2017-10-12
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