Invention Grant
- Patent Title: Systems and methods for measuring surface temperature
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Application No.: US15386768Application Date: 2016-12-21
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Publication No.: US10393592B2Publication Date: 2019-08-27
- Inventor: Paul J. Diglio
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G01K7/00
- IPC: G01K7/00 ; G01K1/00 ; G01K3/00 ; G01K3/14 ; G01K1/02

Abstract:
Disclosed is a system for measuring a surface temperature. The system may comprise a printed circuit board, an insulator block, a conductive probe, a plurality of temperature sensors, and a plurality of compressive contact pins. The conductive probe may have a first surface and a second surface opposite the first surface. The conductive probe may be coupled to the insulator block. The plurality of temperature sensors may be coupled to the insulator block and translatable in a first direction within the insulator block. Translation of the plurality of temperature sensors in the first direction may cause each of the plurality of temperature sensors to contact the first surface of the conductive probe. The plurality of compressive contact pins may each be electrically couple a corresponding temperature sensor to the printed circuit board.
Public/Granted literature
- US20180172521A1 SYSTEMS AND METHODS FOR MEASURING SURFACE TEMPERATURE Public/Granted day:2018-06-21
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