Invention Grant
- Patent Title: Apparatus for analyzing ion kinetics in dielectrics
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Application No.: US14930295Application Date: 2015-11-02
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Publication No.: US10393697B2Publication Date: 2019-08-27
- Inventor: Sabine Gruber , Thomas Aichinger , Stefan Krivec , Thomas Ostermann
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Priority: DE102014115980 20141103
- Main IPC: G01N27/447
- IPC: G01N27/447 ; G01N27/453 ; G01N27/27 ; G01N27/414

Abstract:
An apparatus for analyzing ion kinetics in a dielectric probe structure includes an ion reservoir abutting the dielectric probe structure and configured to supply mobile ions to the dielectric probe structure, a capacitor structure configured to generate an electric field in the dielectric probe structure along a vertical direction, and an electrode structure configured to generate an electrophoretic force on mobile ions in the dielectric probe structure along a lateral direction. A method for analyzing ion kinetics in the dielectric probe structure of the apparatus is also provided.
Public/Granted literature
- US20160139077A1 Apparatus for Analyzing Ion Kinetics in Dielectrics Public/Granted day:2016-05-19
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