Invention Grant
- Patent Title: Margin test for multiple-time programmable memory (MTPM) with split wordlines
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Application No.: US15730078Application Date: 2017-10-11
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Publication No.: US10395752B2Publication Date: 2019-08-27
- Inventor: John A. Fifield , Eric D. Hunt-Schroeder , Darren L. Anand
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Roberts Mlotkowski Safran Cole & Calderon, P.C.
- Agent Michael Le Strange; Andrew M. Calderon
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C29/50 ; H01L27/11517
Abstract:
The present disclosure relates to a structure which includes a twin-cell memory which includes a first device and a second device and which is configured to store data which corresponds to a threshold voltage difference between the first device controlled by a first wordline and the second device controlled by a second wordline.
Public/Granted literature
- US20190108894A1 MARGIN TEST FOR MULTIPLE-TIME PROGRAMMABLE MEMORY (MTPM) WITH SPLIT WORDLINES Public/Granted day:2019-04-11
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