Invention Grant
- Patent Title: Contact-type position measuring device and measuring method using the same
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Application No.: US15535799Application Date: 2015-12-01
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Publication No.: US10422620B2Publication Date: 2019-09-24
- Inventor: Koji Sato
- Applicant: DMG MORI CO., LTD.
- Applicant Address: JP Yamatokoriyama-Shi, Nara
- Assignee: DMG MORI CO., LTD.
- Current Assignee: DMG MORI CO., LTD.
- Current Assignee Address: JP Yamatokoriyama-Shi, Nara
- Agency: IP Business Solutions, LLC
- Priority: JP2014-252937 20141215
- International Application: PCT/JP2015/083714 WO 20151201
- International Announcement: WO2016/098576 WO 20160623
- Main IPC: G01B5/12
- IPC: G01B5/12 ; B23Q17/20
Abstract:
A contact-type position measuring device is configured by a straight hole diameter measuring probe measuring a diameter of straight hole by moving in a radius direction and contacting to an internal peripheral surface of a straight hole, which extends to an axis direction; and a chamfered hole diameter measuring probe measuring a diameter of chamfered hole by moving in the axis direction and contacting to an internal peripheral surface of a chamfered hole.
Public/Granted literature
- US20170363404A1 CONTACT-TYPE POSITION MEASURING DEVICE AND MEASURING METHOD USING THE SAME Public/Granted day:2017-12-21
Information query
