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公开(公告)号：US10422620B2
公开(公告)日：2019-09-24
申请号：US15535799
申请日：2015-12-01
Applicant: DMG MORI CO., LTD.
Inventor： Koji Sato
Abstract: A contact-type position measuring device is configured by a straight hole diameter measuring probe measuring a diameter of straight hole by moving in a radius direction and contacting to an internal peripheral surface of a straight hole, which extends to an axis direction; and a chamfered hole diameter measuring probe measuring a diameter of chamfered hole by moving in the axis direction and contacting to an internal peripheral surface of a chamfered hole.
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