Invention Grant
- Patent Title: X-ray inspection device
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Application No.: US16326547Application Date: 2017-08-03
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Publication No.: US10422757B2Publication Date: 2019-09-24
- Inventor: Kazuyuki Sugimoto , Kazuhiro Suhara
- Applicant: ISHIDA CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ISHIDA CO., LTD.
- Current Assignee: ISHIDA CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2016-161458 20160819
- International Application: PCT/JP2017/028304 WO 20170803
- International Announcement: WO2018/034170 WO 20180222
- Main IPC: G01N23/18
- IPC: G01N23/18 ; G01N23/04 ; H05G1/30 ; G06T7/00 ; H05G1/10

Abstract:
An X-ray inspection apparatus includes an X-ray irradiation unit that irradiates an article with X-rays, an X-ray detection unit that detects the X-rays transmitted through the article, an inspection unit that generates an X-ray transmission image of the article based on a signal output from the X-ray detection unit and performs inspection of the article based on the X-ray transmission image, and a control unit that controls the X-ray irradiation unit and the X-ray detection unit. The control unit executes a first control of controlling the X-ray irradiation unit such that an irradiation output is increased if a detection output of the X-ray detection unit is decreased when the control unit controls the X-ray irradiation unit such that the irradiation output of the X-ray irradiation unit becomes a first irradiation output. The control unit executes the first control in a state where the article is not irradiated with the X-rays.
Public/Granted literature
- US20190212280A1 X-RAY INSPECTION DEVICE Public/Granted day:2019-07-11
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