Invention Grant
- Patent Title: Poly-phased inductively coupled plasma source
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Application No.: US15084143Application Date: 2016-03-29
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Publication No.: US10431425B2Publication Date: 2019-10-01
- Inventor: Jozef Brcka
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood Herron & Evans LLP
- Main IPC: H01J37/32
- IPC: H01J37/32

Abstract:
Embodiments of systems and methods for a poly-phased inductively coupled plasma source are described. In an embodiment, a system may include a metal source configured to supply a metal for ionized physical vapor deposition on a substrate in a process chamber. The system may also include a high-density plasma source configured to generate a dense plasma, the high-density plasma source comprising a plurality of inductively coupled antennas. Additionally, the system may include a substrate bias source configured to provide a potential necessary to thermalize and ionize the plasma. In such embodiments, each antenna is configured to receive power at a phase orientation determined according to a phase arrangement.
Public/Granted literature
- US20170243720A1 Poly-phased Inductively Coupled Plasma Source Public/Granted day:2017-08-24
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