Invention Grant
- Patent Title: Estimating contamination during focused sampling
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Application No.: US14975708Application Date: 2015-12-18
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Publication No.: US10472960B2Publication Date: 2019-11-12
- Inventor: Ryan Sangjun Lee , Adriaan Gisolf , Youxiang Zuo
- Applicant: Schlumberger Technology Corporation
- Applicant Address: US TX Sugar Land
- Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee Address: US TX Sugar Land
- Agent Trevor G. Grove
- Main IPC: E21B49/08
- IPC: E21B49/08 ; G06Q50/02

Abstract:
Disclosed are methods and apparatus pertaining to processing in-situ, real-time data associated with fluid obtained by a downhole sampling tool. The processing includes generating a population of values for Ĉ, where each value of Ĉ is an estimated value of a fluid property for native formation fluid within the obtained fluid. The obtained data is iteratively fit to a predetermined model in linear space. The model relates the fluid property to pumpout volume or time. Each iterative fitting utilizes a different one of the values for Ĉ. A value Ĉ* is identified as the one of the values for Ĉ that minimizes model fit error in linear space based on the iterative fitting. Selected values for Ĉ that are near Ĉ* are then assessed to determine which one has a minimum integral error of nonlinearity in logarithmic space.
Public/Granted literature
- US20160186562A1 Estimating Contamination During Focused Sampling Public/Granted day:2016-06-30
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