A method for monitoring temperature of an electronic element is provided. The method is used in an embedded controller of a device and includes: determining whether the temperature reading is higher than or equal to a temperature threshold; increasing a time value of a timer with an accumulated time value when the temperature reading is higher than or equal to the temperature threshold; determining whether the time value is greater than or equal to a time threshold; and transmitting a notification signal to a basic input/output system (BIOS) to notify the BIOS to read the temperature reading when the time value is greater than or equal to the time threshold.