Invention Grant
- Patent Title: Methods to introduce sub-micrometer, symmetry-breaking surface corrugation to silicon substrates to increase light trapping
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Application No.: US15904296Application Date: 2018-02-23
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Publication No.: US10483415B2Publication Date: 2019-11-19
- Inventor: Sang Eon Han , Brittany R. Hoard , Sang M. Han , Swapnadip Ghosh
- Applicant: STC.UNM
- Applicant Address: US NM Albuquerque
- Assignee: STC.UNM
- Current Assignee: STC.UNM
- Current Assignee Address: US NM Albuquerque
- Agency: MH2 Technology Law Group LLP
- Main IPC: G02B1/00
- IPC: G02B1/00 ; H01L31/0236 ; H01L31/18 ; H01L31/0747 ; H01L31/20 ; H03H9/10 ; H03H9/145 ; H03H9/25

Abstract:
Provided is a method for fabricating a nanopatterned surface. The method includes forming a mask on a substrate, patterning the substrate to include a plurality of symmetry-breaking surface corrugations, and removing the mask. The mask includes a pattern defined by mask material portions that cover first surface portions of the substrate and a plurality of mask space portions that expose second surface portions of the substrate, wherein the plurality of mask space portions are arranged in a lattice arrangement having a row and column, and the row is not oriented parallel to a [110] direction of the substrate. The patterning the substrate includes anisotropically removing portions of the substrate exposed by the plurality of spaces.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B1/00 | 按制造材料区分的光学元件;用于光学元件的光学涂层 |