Invention Grant
- Patent Title: Apparatus and method for measurement, and program
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Application No.: US15762120Application Date: 2016-09-15
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Publication No.: US10508911B2Publication Date: 2019-12-17
- Inventor: Shingo Tsurumi , Masashi Eshima , Takaaki Kato , Tatsuki Kashitani , Akihiko Kaino , Masaki Fukuchi , Takuto Motoyama , Suguru Aoki
- Applicant: Sony Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: JP2015-190832 20150929
- International Application: PCT/JP2016/077225 WO 20160915
- International Announcement: WO2017/057016 WO 20170406
- Main IPC: G06T1/00
- IPC: G06T1/00 ; G06T7/55 ; G01C11/02 ; G01C11/30 ; G01C21/36 ; G01C3/08 ; H04N5/225 ; H04N5/232 ; B60Q9/00 ; B60R1/00

Abstract:
The present technique relates to an apparatus and a method for measurement, and a program each of which enables distance estimation to be more simply carried out with higher accuracy.A three-dimensional measurement apparatus has a rotation control portion controlling rotation of a photographing portion by a rotation mechanism in such a way that the photographing portion is rotated with a center of rotation as an axis in a state in which a distance from the center of rotation of the rotation mechanism portion to a focal point position of the photographing portion is a constant distance; and a distance calculating portion calculating a distance to an object on a space on the basis of a plurality of photographed images obtained through photographing in positions different from one another by the photographing portion in a state in which the photographing portion is rotated.
Public/Granted literature
- US20180274915A1 APPARATUS AND METHOD FOR MEASUREMENT, AND PROGRAM Public/Granted day:2018-09-27
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