- 专利标题: Voltage monitoring circuit that manages voltage drift caused from negative bias temperature instability
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申请号: US15966997申请日: 2018-04-30
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公开(公告)号: US10520963B2公开(公告)日: 2019-12-31
- 发明人: Zhenghao Cui , Yadan Shen
- 申请人: Texas Instruments Incorporated
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Laurence J. Bassuk; Charles A. Brill; Frank D. Cimino
- 主分类号: G05F1/575
- IPC分类号: G05F1/575 ; G01R19/00 ; H03F1/34 ; H03G5/28
摘要:
Regulating voltages at inputs of an electronic device by performing at least the following: receiving, at a voltage monitoring circuit, a monitoring voltage corresponding to a power system, determining, at the voltage monitoring circuit, whether the monitoring voltage is equal to or exceeds a monitoring threshold voltage, receiving, at the voltage monitoring circuit, an output indicating whether an inputted reference voltage and an inputted feedback voltage at a comparator circuit differs, regulating, at the voltage monitoring circuit, a feedback voltage to match the inputted reference voltage based on the output and a determination that the monitoring voltage is equal to or exceeds the monitoring threshold voltage, and providing, from the voltage monitoring circuit, the feedback voltage as an updated inputted feedback voltage for the comparator circuit.
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