Invention Grant
- Patent Title: Laser machining device that detects contamination of optical system before laser machining
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Application No.: US16105592Application Date: 2018-08-20
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Publication No.: US10556295B2Publication Date: 2020-02-11
- Inventor: Takashi Izumi
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: RatnerPrestia
- Priority: JP2017-160441 20170823
- Main IPC: B23K26/70
- IPC: B23K26/70 ; B23K26/064 ; B23K26/08

Abstract:
A laser machining device includes a contamination determining part that determines contamination of an external optical system before laser machining; the contamination determining part includes a lens contamination determining section that determines contamination of a lens in the external optical system on the basis of a comparison between a first measurement value, which is measured by an energy amount measuring part in a state where the external optical system is not heated, and a second measurement value, which is measured by the energy amount measuring part in a state where the external optical system is heated.
Public/Granted literature
- US20190061066A1 LASER MACHINING DEVICE THAT DETECTS CONTAMINATION OF OPTICAL SYSTEM BEFORE LASER MACHINING Public/Granted day:2019-02-28
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