Disclosed embodiments include a testing system that electrically connects to an integrated circuit (IC) having ferroelectric memory (FRAM) cells. The testing system programs the FRAM cells to a first data state and then iteratively reads the programmed cells at a plurality of reference voltages to identify a reference voltage limit that indicates a first occurrence at which at least one of the cells fails to return the first data state when read. Iteratively reading the cells includes reading each cell at an initial reference voltage at which all the cells return the first data state, and then reading each of the programmed cells at each of the remaining reference voltages by incrementally changing the initial reference voltage in one direction until the reference voltage limit is identified. The testing system sets the reference in the IC at an operating level based on the reference voltage limit.