- Patent Title: IC die, ultrasound probe, ultrasonic diagnostic system and method
-
Application No.: US15300307Application Date: 2015-03-31
-
Publication No.: US10586753B2Publication Date: 2020-03-10
- Inventor: Egbertus Reinier Jacobs , Johannes Wilhelmus Weekamp , Niels Cornelis Wilhelmus Johannes Rijkers
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP14162615 20140331
- International Application: PCT/EP2015/057030 WO 20150331
- International Announcement: WO2015/150385 WO 20151008
- Main IPC: H01L23/482
- IPC: H01L23/482 ; A61B8/12 ; A61B8/00 ; H01L23/28 ; H01L23/00 ; H01L23/04 ; H01L23/48 ; B06B1/02 ; H01L21/78 ; H02N1/00 ; H05K1/18 ; H01L41/047

Abstract:
An integrated circuit (IC) die (100) is disclosed having a major surface delimited by at least one edge (102) of the IC die, said major surface carrying a plurality of electrically conductive contact plates (130) extending from said major surface beyond the at least one edge such that each contact plate includes an exposed contact surface portion (132) delimited by the at least one edge for mating with an electrically conductive further contact surface portion (230) on at least one further edge (220) of a body (200), said at least one further edge delimiting a cavity for receiving the IC die. An ultrasound probe including such an IC die and a method of providing such an IC die with contacts are also disclosed.
Public/Granted literature
- US20170136496A1 IC DIE, ULTRASOUND PROBE, ULTRASONIC DIAGNOSTIC SYSTEM AND METHOD Public/Granted day:2017-05-18
Information query
IPC分类: