Invention Grant
- Patent Title: Measurement apparatus and Method
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Application No.: US15656493Application Date: 2017-07-21
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Publication No.: US10588137B2Publication Date: 2020-03-10
- Inventor: Jian Zhang , Yuanjie Li , Yongxing Zhou , Qinghai Zeng
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Main IPC: H04W72/08
- IPC: H04W72/08 ; H04W24/10 ; H04W36/00 ; H04L5/00 ; H04B7/06 ; H04W84/12

Abstract:
A measurement apparatus and method. The method includes sending, by a radio access network system, information about a subframe mode corresponding to at least one beam, where the information about the subframe mode instructs a UE to perform measurement according to the information about the subframe mode, and the method further includes receiving, by the radio access network system, a measurement result sent by the UE. The measurement apparatus and method can be used to perform the measurement in a millimeter wave scenario.
Public/Granted literature
- US20170325244A1 Measurement Apparatus and Method Public/Granted day:2017-11-09
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