Invention Grant
- Patent Title: Automated analysis device
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Application No.: US15554086Application Date: 2016-02-01
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Publication No.: US10591498B2Publication Date: 2020-03-17
- Inventor: Koichi Nishimura , Hiroyuki Takayama
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2015-039787 20150302
- International Application: PCT/JP2016/052848 WO 20160201
- International Announcement: WO2016/139997 WO 20160909
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/10 ; G01N35/02 ; G01N33/50

Abstract:
Provided is an automatic analyzer capable of replacing an insertion mechanism while suppressing occurrence of dispensing abnormality and analysis result abnormality accompanying deterioration of the insertion mechanism. Included are an insertion mechanism that is inserted into a closed container through a lid of the container; a storage unit that stores an insertion history count corresponding to a cumulative load of the insertion mechanism caused by inserting the insertion mechanism into a plurality of the containers, and an allowable insertion history count which is an allowable value of the insertion history count; and a control unit that compares the insertion history count with the allowable insertion history count and performs control to make a notification to an operator in a case where the insertion history count reaches the allowable insertion history count.
Public/Granted literature
- US20180038879A1 AUTOMATED ANALYSIS DEVICE Public/Granted day:2018-02-08
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