Invention Grant
- Patent Title: Substrate edge detection
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Application No.: US16086367Application Date: 2017-03-23
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Publication No.: US10607873B2Publication Date: 2020-03-31
- Inventor: Eric Anthony Janda , Cayetano Sánchez-Fabrés Cobaleda , Bernd Peter Geh , Simon Gijsbert Josephus Mathijssen
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2017/056926 WO 20170323
- International Announcement: WO2017/167637 WO 20171005
- Main IPC: G03F9/00
- IPC: G03F9/00 ; H01L21/67 ; H01L21/68 ; G03F7/20

Abstract:
A method including directing, by an optical system, an illumination beam to a surface of a substrate, providing relative motion between the directed illumination beam and the substrate until the directed illumination beam is illuminated on a grating underneath an edge or a notch of the substrate, diffracting, by the grating, at least a portion of the illumination beam, and detecting, by the detector, the diffracted illumination.
Public/Granted literature
- US20190101839A1 SUBSTRATE EDGE DETECTION Public/Granted day:2019-04-04
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