Invention Grant
- Patent Title: Fail-safe clock monitor with fault injection
-
Application No.: US16143841Application Date: 2018-09-27
-
Publication No.: US10649487B2Publication Date: 2020-05-12
- Inventor: Kevin Kilzer , Aditya Nukala
- Applicant: Microchip Technology Incorporated
- Applicant Address: US AZ Chandler
- Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee Address: US AZ Chandler
- Agency: Slayden Grubert Beard PLLC
- Main IPC: G06F1/04
- IPC: G06F1/04 ; G06F11/16 ; G06F1/14 ; G06F1/10 ; G06F1/08

Abstract:
A system for testing a clock monitor includes a fault injection circuit, a control circuit, and a clock monitor circuit to evaluate a clock source signal from a clock source. The fault injection circuit is to modify or replace the clock source signal from the clock source to yield a modified clock signal, and send the modified clock signal to the clock monitor circuit. The clock monitor circuit is to receive an input clock signal, determine whether the input clock signal indicates a faulty clock source, and issue a clock corrective action if the input clock signal indicates a faulty clock source. The control circuit is to monitor for the clock corrective action, and determine, based on whether the clock corrective action is issued, whether the clock monitor circuit is operating correctly.
Public/Granted literature
- US20200012313A1 Fail-Safe Clock Monitor with Fault Injection Public/Granted day:2020-01-09
Information query