Invention Grant
- Patent Title: Field emission device and field emission method
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Application No.: US16312565Application Date: 2017-03-16
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Publication No.: US10651001B2Publication Date: 2020-05-12
- Inventor: Daizo Takahashi , Michihiro Hatanaka
- Applicant: MEIDENSHA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: MEIDENSHA CORPORATION
- Current Assignee: MEIDENSHA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1d75b5eb
- International Application: PCT/JP2017/010551 WO 20170316
- International Announcement: WO2017/221479 WO 20171228
- Main IPC: H01J1/14
- IPC: H01J1/14 ; H01J35/06 ; H01J1/304 ; H01J3/02 ; H01J7/18 ; H01J35/12

Abstract:
An emitter (3) and a target (7) are arranged so as to face each other in a vacuum chamber (1), and a guard electrode (5) is provided at an outer circumferential side of an electron generating portion (31) of the emitter (3). The emitter (3) is supported movably in both end directions of the vacuum chamber (1) by the emitter supporting unit (4) having a movable body (40). The emitter supporting unit (4) is operated by an operating unit (6) connected to the emitter supporting unit (4). By operating the emitter supporting unit (4) by the operating unit (6), a distance between the electron generating portion (31) of the emitter (3) and the target (7) is changed, and a position of the emitter (3) is fixed at an arbitrary distance, then field emission is performed with the position of the emitter (3) fixed.
Public/Granted literature
- US20190333730A1 FIELD EMISSION DEVICE AND FIELD EMISSION METHOD Public/Granted day:2019-10-31
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