Invention Grant
- Patent Title: Semiconductor device and method of fabricating the same
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Application No.: US15864410Application Date: 2018-01-08
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Publication No.: US10651191B2Publication Date: 2020-05-12
- Inventor: Ji-Hoon Choi , Sunggil Kim , Seulye Kim , HongSuk Kim , Phil Ouk Nam , Jaeyoung Ahn
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@ff9b1b5
- Main IPC: H01L27/11582
- IPC: H01L27/11582 ; H01L27/1157 ; H01L27/11573 ; H01L27/11575 ; H01L29/792 ; H01L29/423 ; H01L29/04 ; H01L27/11565 ; H01L29/51

Abstract:
A semiconductor device may include a substrate, an electrode structure including electrodes stacked on the substrate, an upper semiconductor pattern penetrating at least a portion of the electrode structure, and a lower semiconductor pattern between the substrate and the upper semiconductor pattern. The upper semiconductor pattern includes a gap-filling portion and a sidewall portion extending from the gap-filling portion in a direction away from the substrate, the lower semiconductor pattern includes a concave top surface, the gap-filling portion fills a region enclosed by the concave top surface, a top surface of the gap-filling portion has a rounded shape that is deformed toward the substrate, and a thickness of the sidewall portion is less than a thickness of the gap-filling portion.
Public/Granted literature
- US20180315770A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2018-11-01
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