Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
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Application No.: US15980635Application Date: 2018-05-15
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Publication No.: US10651301B2Publication Date: 2020-05-12
- Inventor: Ryo Kanda , Hitoshi Matsuura
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Tokyo
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Tokyo
- Agency: SGPatents PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4f75194a
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/06 ; H01L29/10 ; H01L29/08 ; H01L29/739 ; H01L29/78 ; H01L29/40

Abstract:
In one embodiment, a semiconductor device includes a semiconductor substrate having an upper surface, a trench electrode placed inside a trench formed on the upper surface, and a trench insulating film placed between the trench electrode and the semiconductor substrate, and the semiconductor substrate includes a drift layer, a floating layer for electric field reduction, a hole barrier layer, a body layer and an emitter layer, and the emitter layer, the body layer and the hole barrier layer are separated from the drift layer by the floating layer for electric field reduction, and a path of a carrier passing through an inverted layer formed in the body layer includes the body layer, the hole barrier layer, a non-inverted region of the floating layer for electric field reduction, and the drift layer.
Public/Granted literature
- US20190006496A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2019-01-03
Information query
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