An integrated circuit package and a system including the integrated circuit package as well as a process for assembling the integrated circuit package are provided. The integrated circuit package includes a first die manufactured on a first wafer utilizing a first node size, a second die manufactured on a second wafer utilizing a second node size, and a substrate coupled to the second die at a plurality of bump sites on a bottom surface of the second die. The first die may be mounted on a top surface of the second die utilizing a hybrid wafer bonding technique, micro bumps, or electrode-less plating.