Invention Grant
- Patent Title: Maintenance prediction of electronic devices using periodic thermal evaluation
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Application No.: US13728174Application Date: 2012-12-27
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Publication No.: US10667438B2Publication Date: 2020-05-26
- Inventor: Robin A. Steinbrecher , Nishi Ahuja , Sandeep Ahuja
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: International IP Law Group, P.L.L.C.
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G21C17/00 ; G01K1/08 ; H05K7/20 ; G05B23/02
Abstract:
A method for determining whether to perform maintenance for an electronic device includes generating a baseline characterization of thermal performance for a heat-generating component of the electronic device at a baseline date. The method also includes generating an assessment characterization of the thermal performance at an assessment date after the baseline date. The method further includes generating a historical trend that includes the baseline characterization and the assessment characterization. Additionally, the method includes determining whether to perform maintenance for the heat-generating component based on the historical trend and a specified maintenance parameter.
Public/Granted literature
- US20140188434A1 MAINTENANCE PREDICTION OF ELECTRONIC DEVICES USING PERIODIC THERMAL EVALUATION Public/Granted day:2014-07-03
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