Invention Grant
- Patent Title: Methods of forming an apparatus, and related apparatuses and electronic systems
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Application No.: US16235957Application Date: 2018-12-28
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Publication No.: US10707212B1Publication Date: 2020-07-07
- Inventor: Kentaro Ishii , Yongjun J. Hu , Amirhasan Nourbakhsh , Durai Vishak Nirmal Ramaswamy , Christopher W. Petz , Luca Fumagalli
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H01L27/108
- IPC: H01L27/108

Abstract:
A method of forming an apparatus comprises forming a first metal nitride material over an upper surface of a conductive material within an opening extending through at least one dielectric material through a non-conformal deposition process. A second metal nitride material is formed over an upper surface of the first metal nitride material and side surfaces of the at least one dielectric material partially defining boundaries of the opening through a conformal deposition process. A conductive structure is formed over surfaces of the second metal nitride material within the opening. Apparatuses and electronic systems are also described.
Public/Granted literature
- US20200212046A1 METHODS OF FORMING AN APPARATUS, AND RELATED APPARATUSES AND ELECTRONIC SYSTEMS Public/Granted day:2020-07-02
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