- 专利标题: Radiation event protection circuit with double redundancy and latch
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申请号: US16271474申请日: 2019-02-08
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公开(公告)号: US10715143B1公开(公告)日: 2020-07-14
- 发明人: Agatino Antonino Alessandro , Carmelo Ardizzone
- 申请人: STMicroelectronics S.r.l.
- 申请人地址: IT Agrate Brianza (MB)
- 专利权人: STMicroelectronics S.r.l.
- 当前专利权人: STMicroelectronics S.r.l.
- 当前专利权人地址: IT Agrate Brianza (MB)
- 代理机构: Crowe & Dunlevy
- 主分类号: H03K19/003
- IPC分类号: H03K19/003 ; H03K19/007
摘要:
Disclosed herein is a circuit including first and second input circuits. The first input circuit is configured to receive first and second logic signals and to source current to first and second control nodes if at least one of the first and second logic signals is at a logic low. The second input circuit is configured to receive the first and second logic signals and to sink current from the first and second control nodes if at least one of the first and second logic signals is at a logic high. A first output circuit is configured to source current to an output node when current is sunk from the first control node. A second output circuit is configured to sink current from the output node when current is sourced to the second control node. A latch is coupled to the output node.
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