Invention Grant
- Patent Title: Integrated circuit devices and methods of fabricating the same
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Application No.: US16043398Application Date: 2018-07-24
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Publication No.: US10727233B2Publication Date: 2020-07-28
- Inventor: Seok-han Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel, P.A.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@30c93d4d
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L27/108 ; H01L21/764 ; H01L21/768 ; H01L21/311 ; H01L23/485 ; H01L23/522 ; H01L23/532 ; H01L21/8234 ; H01L21/762 ; H01L21/02

Abstract:
An integrated circuit device includes: a conductive line structure including a conductive line and an insulating capping pattern; and an insulating spacer including an inner spacer and a first insulating spacer, the inner spacer and the first insulating spacer on a sidewall of the conductive line structure. The first insulating spacer includes: a slit portion; a lower insulating portion spaced apart from the inner spacer such that a separation distance between a portion of the lower insulating portion and the inner spacer decreases with increasing vertical distance from the substrate; and an upper insulating portion contacting the inner spacer. A method of forming the insulating spacer includes: forming a polymer layer on the inner spacer; forming a first insulating spacer layer which contacts each of the inner spacer and the polymer layer; and forming a first insulating spacer by partially removing the first insulating spacer layer.
Public/Granted literature
- US20190123051A1 INTEGRATED CIRCUIT DEVICES AND METHODS OF FABRICATING THE SAME Public/Granted day:2019-04-25
Information query
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