Invention Grant
- Patent Title: Unmerged epitaxial process for FinFET devices with aggressive fin pitch scaling
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Application No.: US15986031Application Date: 2018-05-22
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Publication No.: US10734499B2Publication Date: 2020-08-04
- Inventor: Xiuyu Cai , Kangguo Cheng , Ali Khakifirooz , Ruilong Xie , Tenko Yamashita
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION , GLOBALFOUNDRIES INC.
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/06 ; H01L29/78 ; H01L29/10 ; H01L21/3065 ; H01L21/308 ; H01L21/20 ; H01L21/3105 ; H01L21/8234 ; H01L27/088

Abstract:
Methods for forming a semiconductor device include forming a first spacer on a plurality of fins. A second spacer is formed on the first spacer, the second spacer being formed from a different material from the first spacer. Gaps between the fins are filled with a support material. The first spacer and second spacer are polished to expose a top surface of the plurality of fins. All of the support material is etched away after polishing the first spacer and second spacer. The plurality of fins is etched below a bottom level of the first spacer to form a fin cavity. Material from the first spacer is removed to expand the fin cavity. Fin material is grown directly on the etched plurality of fins to fill the fin cavity.
Public/Granted literature
- US20180277648A1 UNMERGED EPITAXIAL PROCESS FOR FINFET DEVICES WITH AGGRESSIVE FIN PITCH SCALING Public/Granted day:2018-09-27
Information query
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