Invention Grant
- Patent Title: Semiconductor device, electronic circuit, and method of inspecting semiconductor device
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Application No.: US16534522Application Date: 2019-08-07
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Publication No.: US10746812B2Publication Date: 2020-08-18
- Inventor: Kazuo Henmi , Ken Katano
- Applicant: RENESAS ELECTRONICS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@19747b1b
- Main IPC: G01R31/70
- IPC: G01R31/70 ; H03F3/45

Abstract:
A semiconductor device includes a semiconductor chip having first, second and third pads, first and second external terminals to which a power supply potential or a reference potential is supplied, first and second wires connecting the first and second external terminals and the first and second pads, and a third wire connecting the second external terminal and the third pad. The semiconductor chip further includes a first internal wiring connected to the first and second pads, a second internal wiring connected to the third pad, and a detection circuit. The detection circuit includes: a current source for passing a current through the first and second internal wirings; first and second resistive elements connected between the current source and the first and second internal wirings; and an amplifier circuit for amplifying a relative potential difference generated between the first and second resistive elements and outputting a detection signal.
Public/Granted literature
- US20200072891A1 SEMICONDUCTOR DEVICE, ELECTRONIC CIRCUIT, AND METHOD OF INSPECTING SEMICONDUCTOR DEVICE Public/Granted day:2020-03-05
Information query
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