Invention Grant
- Patent Title: Probe card for a testing apparatus of electronic devices with enhanced filtering properties
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Application No.: US15718561Application Date: 2017-09-28
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Publication No.: US10761113B2Publication Date: 2020-09-01
- Inventor: Flavio Maggioni
- Applicant: TECHNOPROBE S.p.A.
- Applicant Address: IT Cernusco Lombardone
- Assignee: TECHNOPROBE S.P.A.
- Current Assignee: TECHNOPROBE S.P.A.
- Current Assignee Address: IT Cernusco Lombardone
- Agency: Seed Intellectual Property Law Group LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4d1a1189
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R31/28 ; H05K1/02 ; G01R1/067

Abstract:
A probe card for a testing apparatus of electronic devices comprises at least one testing head housing a plurality of contact probes, each contact probe having at least one contact tip abutting onto contact pads of a device under test, as well as at least one space transformer realizing a spatial transformation of the distances between contact pads made on its opposite sides and connected by means of suitable conductive tracks or planes, as well as a plurality of filtering capacitors provided between the space transformer and a PCB, which comprises direct conductive tracks or planes contacting conductive portions of the filtering capacitors.
Public/Granted literature
- US20180024167A1 PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHANCED FILTERING PROPERTIES Public/Granted day:2018-01-25
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