Invention Grant
- Patent Title: Image sensor testing probe card
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Application No.: US15285731Application Date: 2016-10-05
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Publication No.: US10775413B2Publication Date: 2020-09-15
- Inventor: Chih-Pin Jen , Ming-Chang Yang , Sheng-Kuai Yang
- Applicant: OmniVision Technologies, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lathrop GPM LLP
- Main IPC: G01R31/311
- IPC: G01R31/311 ; G01R1/073 ; G01R3/00

Abstract:
A method of increasing uniformity in light from a light source at a plurality of targets of the light includes locating a plurality of movable aperture elements between the light source and the targets. Each aperture element defines an aperture through which the light passes from the light source to an associated one of the plurality of targets associated with the aperture element along a longitudinal axis of the aperture element. The method also includes moving at least one of the aperture elements along its longitudinal axis to change a feature of light incident on the target associated with the aperture element.
Public/Granted literature
- US20170023614A1 Image Sensor Testing Probe Card Public/Granted day:2017-01-26
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