Invention Grant
- Patent Title: Extended error correction in storage device
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Application No.: US16236094Application Date: 2018-12-28
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Publication No.: US10776201B2Publication Date: 2020-09-15
- Inventor: David Aaron Palmer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C29/52 ; G06F12/10 ; H03M13/29

Abstract:
Devices and techniques for extended error correction in a storage device are described herein. A first set of data, that has a corresponding logical address and physical address, is received. A second set of data can be selected based on the logical address. Secondary error correction data can be computed from the first set of data and the second set of data. Primary error correction data can be differentiated from the secondary error correction data by being computed from the first set of data and a third set of data. The third set of data can be selected based on the physical address of the first set of data. The secondary error correction data can be written to the storage device based on the logical address.
Public/Granted literature
- US20200210283A1 EXTENDED ERROR CORRECTION IN STORAGE DEVICE Public/Granted day:2020-07-02
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