Invention Grant
- Patent Title: Simulation methods and systems for predicting SER
-
Application No.: US15645227Application Date: 2017-07-10
-
Publication No.: US10783306B2Publication Date: 2020-09-22
- Inventor: Udit Monga , Jong Wook Jeon , Ken Machida , Ui Hui Kwon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7dfab98b
- Main IPC: G06F30/367
- IPC: G06F30/367 ; H01L29/78 ; H01L27/088 ; G06F17/18 ; G06F111/20 ; H01L23/556 ; H01L23/60 ; H01L29/06

Abstract:
A soft error rate (SER) associated with a design of a semiconductor circuit may be predicted based on implementing a simulation associated with the design. The simulation may include generating a simulation environment based on information indicating the design, performing a particle strike simulation based on the simulation environment to generate charge deposition information, and calculating a collected charge quantity from the charge deposition information. A determination may be made whether the SER predicted based on the collected charge quantity at least meets a threshold. The design may be modified, and the simulation repeated, if the predicted SER value meets a threshold value. A semiconductor circuit may be manufactured based on the design if the predicted SER value is less than the threshold value.
Public/Granted literature
- US20180121587A1 SIMULATION METHODS AND SYSTEMS FOR PREDICTING SER Public/Granted day:2018-05-03
Information query