Invention Grant
- Patent Title: Chemical mechanical polishing apparatus
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Application No.: US15773904Application Date: 2016-08-08
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Publication No.: US10784113B2Publication Date: 2020-09-22
- Inventor: Kyunam Park
- Applicant: KCTECH CO., LTD.
- Applicant Address: KR Anseong-si
- Assignee: KCTECH CO., LTD.
- Current Assignee: KCTECH CO., LTD.
- Current Assignee Address: KR Anseong-si
- Agency: Stein IP, LLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@53f099ad
- International Application: PCT/KR2016/008674 WO 20160808
- International Announcement: WO2017/115968 WO 20170706
- Main IPC: H01L21/304
- IPC: H01L21/304 ; H01L21/306 ; H01L21/67 ; H01L21/02 ; C09G1/02 ; B24B37/12 ; B24B37/20

Abstract:
Provided are a chemical mechanical polishing apparatus and a control method thereof. The chemical mechanical polishing apparatus includes a plurality of polishing platens provided with a polishing pad on an upper surface thereof, and a polishing platen transferring unit for transferring the plurality of polishing platens to different process positions according to a predetermined process sequence. Here, different processes are performed at different process positions.
Public/Granted literature
- US20180330956A1 CHEMICAL MECHANICAL POLISHING APPARATUS AND CONTROL METHOD THEREOF Public/Granted day:2018-11-15
Information query
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