- Patent Title: Metal interconnect structure and method for fabricating the same
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Application No.: US16134902Application Date: 2018-09-18
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Publication No.: US10784153B2Publication Date: 2020-09-22
- Inventor: Yi-How Chou , Tzu-Hao Fu , Tsung-Yin Hsieh , Chih-Sheng Chang , Shih-Chun Tsai , Kun-Chen Ho , Yang-Chou Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1e2afe47
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/522 ; H01L23/532

Abstract:
A method for fabricating metal interconnect structure includes the steps of: forming a first metal interconnection in a first inter-metal dielectric (IMD) layer on a substrate; forming a cap layer on the first metal interconnection; forming a second IMD layer on the cap layer; performing a first etching process to remove part of the second IMD layer for forming an opening; performing a plasma treatment process; and performing a second etching process to remove polymers from bottom of the opening.
Public/Granted literature
- US20200058544A1 METAL INTERCONNECT STRUCTURE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2020-02-20
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