Invention Grant
- Patent Title: Fault tolerant clock monitor system
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Application No.: US16158471Application Date: 2018-10-12
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Publication No.: US10795783B2Publication Date: 2020-10-06
- Inventor: Igor Wojewoda , Bryan Kris , Stephen Bowling , Yong Yuenyongsgool
- Applicant: Microchip Technology Incorporated
- Applicant Address: US AZ Chandler
- Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee Address: US AZ Chandler
- Agency: Slayden Grubert Beard PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/16 ; G06F11/14 ; H03K5/19

Abstract:
A clock monitor includes a test clock input, as a reference clock input, another clock input, a measurement circuit, and control logic. The measurement circuit generates a measurement of a frequency or a duty cycle of the test clock input using the reference clock input, which is compared to a threshold. The control logic determines whether the measurement exceeded the threshold and, based on the measurement exceeding the threshold, cause generation of another measurement of a frequency or a duty cycle using the third clock input in combination with the first clock input or the reference clock input. The control logic may determine whether the other measurement exceeded a threshold and, based on such a determination, further determine that the test clock input or the reference clock input are faulty.
Public/Granted literature
- US20190114235A1 Fault Tolerant Clock Monitor System Public/Granted day:2019-04-18
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