Invention Grant
- Patent Title: Machine learning based method and system for analyzing image artifacts and imaging system failure
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Application No.: US16134219Application Date: 2018-09-18
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Publication No.: US10796181B2Publication Date: 2020-10-06
- Inventor: Kavitha Manickam , Ramesh Venkatesan , Rakesh Shevde , Rajagopalan Sundaresan , Prakruthi Jakathe , Vignesh Singh , Krishnan Varadarajan
- Applicant: GE Precision Healthcare LLC
- Applicant Address: US WI Wauwatosa
- Assignee: GE PRECISION HEALTHCARE LLC
- Current Assignee: GE PRECISION HEALTHCARE LLC
- Current Assignee Address: US WI Wauwatosa
- Agency: Armstrong Teasdale LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/03 ; G06N3/08 ; G06N5/04 ; G06T7/00

Abstract:
Methods and systems for addressing malfunction of a medical imaging device are disclosed. The method includes classifying a type of an image artifact in a medical image acquired by the medical imaging device by using a trained machine learning model. The method also includes analyzing system data associated with acquisition of the medical image to identify one or more system parameters that might have contributed to the type of image artifact and providing an action for addressing the image artifact based on the identified one or more system parameters.
Public/Granted literature
- US20200089983A1 MACHINE LEARNING BASED METHOD AND SYSTEM FOR ANALYZING IMAGE ARTIFACTS AND IMAGING SYSTEM FAILURE Public/Granted day:2020-03-19
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