Invention Grant
- Patent Title: Method and arrangement for determining an abnormal state of a system
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Application No.: US15985600Application Date: 2018-05-21
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Publication No.: US10831586B2Publication Date: 2020-11-10
- Inventor: Rui Li , Henning Ochsenfeld
- Applicant: Rui Li , Henning Ochsenfeld
- Applicant Address: DE Munich
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE Munich
- Agency: Lempia Summerfield Katz LLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2d5d7a94
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06Q10/06 ; G05B23/02
Abstract:
A similarity between a pattern distribution of selected state patterns of system state descriptions in a first set of system state descriptions and an average pattern distribution of the selected state patterns of the system state descriptions in a second set of system state description is determined. The similarity is compared with a plurality of such similarities between the pattern distributions within the second set of system state descriptions and the average pattern distribution in the second set of system state descriptions. An abnormal state of the system is determined using this comparison.
Public/Granted literature
- US20180336082A1 METHOD AND ARRANGEMENT FOR DETERMINING AN ABNORMAL STATE OF A SYSTEM Public/Granted day:2018-11-22
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