公开(公告)号：US10831586B2

公开(公告)日：2020-11-10

申请号：US15985600

申请日：2018-05-21

申请人： Rui Li ,  Henning Ochsenfeld

发明人： Rui Li ,  Henning Ochsenfeld

IPC分类号： G06F11/00 ,  G06F11/07 ,  G06Q10/06 ,  G05B23/02

摘要： A similarity between a pattern distribution of selected state patterns of system state descriptions in a first set of system state descriptions and an average pattern distribution of the selected state patterns of the system state descriptions in a second set of system state description is determined. The similarity is compared with a plurality of such similarities between the pattern distributions within the second set of system state descriptions and the average pattern distribution in the second set of system state descriptions. An abnormal state of the system is determined using this comparison.

公开(公告)号：US20180336082A1

公开(公告)日：2018-11-22

申请号：US15985600

申请日：2018-05-21

申请人： Rui Li ,  Henning Ochsenfeld

发明人： Rui Li ,  Henning Ochsenfeld

IPC分类号： G06F11/07 ,  G06F11/00

CPC分类号： G06F11/079 ,  G05B23/0227 ,  G06F11/006 ,  G06F11/0736 ,  G06F2201/86 ,  G06Q10/0639

摘要： A similarity between a pattern distribution of selected state patterns of system state descriptions in a first set of system state descriptions and an average pattern distribution of the selected state patterns of the system state descriptions in a second set of system state description is determined. The similarity is compared with a plurality of such similarities between the pattern distributions within the second set of system state descriptions and the average pattern distribution in the second set of system state descriptions. An abnormal state of the system is determined using this comparison.