Invention Grant
- Patent Title: Method and apparatus for forming silicon film
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Application No.: US16046222Application Date: 2018-07-26
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Publication No.: US10854449B2Publication Date: 2020-12-01
- Inventor: Satoshi Takagi , Hiroyuki Hayashi , Hsiulin Tsai
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- Priority: JP2017-149866 20170802
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/52 ; C23C16/40 ; C23C16/455 ; C23C16/04 ; C23C16/02 ; C23C16/24

Abstract:
A method of forming a silicon film in a recess formed in a target substrate includes: preparing a target substrate having a recess in which a plurality of different bases is exposed; forming an atomic layer seed on at least an inner surface of the recess by sequentially supplying a raw material gas adapted to the plurality of different bases and a reaction gas reacting with the raw material gas to the target substrate one or more times while heating the target substrate to a first temperature; and forming a silicon film on a surface of the atomic layer seed so as to fill the recess by supplying a first silicon raw material gas to the target substrate while heating the target substrate to a second temperature.
Public/Granted literature
- US20190043719A1 Method and Apparatus for Forming Silicon Film Public/Granted day:2019-02-07
Information query
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